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    LeCroy/D300A-AT/D300A-AT

    • LeCroy/D300A-AT/D300A-AT
    • 欲購買或租賃LeCroy/D300A-AT/D300A-AT?請在線咨詢或拔打24小時電話:13715327187
    D300A-AT/LeCroy縮略圖

    詳細資料:

    D300A-AT 4.0G的帶寬
     
    Exceptional Waveform Fidelity

    WaveLink® probes provide industry leading technology for wideband signal connection to test instruments. The first differential probes to employ SiGe technology, they deliver full system bandwidth when used with WaveRunner®, WavePro®, WaveMaster®, DDA and SDA oscilloscopes up to 6 GHz.

    WaveLink probes:
    • Use transmission line topology in the input section combined with active differential probe technology
    • Maintain good loading characterisitcs across the frequency span

    Very Accurate Eye Pattern Measurements
    WaveLink probes virtually eliminate distortion when measuring signals. This benefit is particularly useful in eye pattern measurements, now routine for systems using fast serial parallel data bus architecture.All WaveLink probes offer:
    • Superior loading characteristics
    • Precise frequency response with outstanding fidelity for high-speed signals
    • Both low loading and frequency response flatness are needed to ensure the signal fidelity required to measure performance accurately.

    D500PT Positioner Mounted Probe Tip Module
    The probe has a very thin form factor, allowing multiple probes to be used when several channels are required to monitor signals from the same small IC. It has 2 mm of Z-axis compliance through spring-loaded telescoping tips, allowing considerable angular freedom relative to the circuit board while still maintaining reliable contact with both inputs. A ball joint between the tip and mounting arm makes it even easier to adjust for placement when already mounted in a positioner. A small thumbscrew allows precise and secure adjustment of the tip spacing.

    The Positioner Mounted Module, D500PT, can be used as a browser in a positioner such as Easy Probe. Because of its thin form factor and spring-loaded tips, it is ideally suited for use with multiple probes in tight areas, such as the back side of boards with ball-grid array packaged ICs.

    儀器保證:

    我們的大多數(shù)設(shè)備在裝運之前均經(jīng)過嚴格的質(zhì)量檢測與校驗。也可申請國家計量證書。

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